Introduction The imminent large-scale rollout of 5G technology imposes new and tough challenges for designers of PCB, network equipment and electronic devices in general. 5G will not only represent an increase in data rates, but it will be a real revolution, with latency times reduced up to 1ms and the use of millimeter waves (mmWave) […]
The post Challenges involved in 5G Testing appeared first on Open Electronics. The author is kurt
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